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Agri Business Review | Monday, January 25, 2021
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Yield maps have genuinely enormous potential. Indeed, as technology improvements in the sector progress, it is certain to become an even more powerful component of smart farming.
FREMONT, CA: In the early 1990s, yield mapping or yield tracking was a breakthrough in precision agriculture. This technique will provide as much information about the soil and final product. It can help reveal differences in soil composition between farm regions, offer moisture content data, and give farmers the tools they need to deal with a wide range of farm-related issues. High-value crops such as onions, carrots, and sweet potatoes necessitate the use of smart agricultural technologies to maximize yields. With several pieces of technology and data, yield mapping can help farmers make the most of their resources. This section focuses on the numerous enhancements to yield maps that are deserving of mention.
Progression in GPS technology: GPS was still in its infancy when yield mapping was initially introduced as a farming practice. Because of this, the first yield mapping product didn't even have a GPS feature. Yield mapping now relies heavily on GPS technology, which provides unprecedented precision.
Precision enhancement: To improve accuracy, erroneous field maps and geographical data plagued early yield monitoring systems, leading to a slew of problems. A decade ago, the ability to use the data generated was limited. Today, yield-mapping precision has skyrocketed, with most systems operating at or near 100 percent accuracy. In addition, computer technology has helped farmers understand, analyze, and implement yield-mapping data. As previously noted, developments in GPS technology have significantly improved yield mapping systems' self-calibration capabilities. In addition, self-calibrating yield monitors are becoming more popular. Earlier, several components had to be manually calibrated regularly by farmers or professionals, increasing the system's vulnerability to errors.
Resolving overlaps: GPS and associated technology advancements have made it possible for yield maps and monitors to display the size and space of each unique farm correctly. As a result, the monitor can recognize and detect when it reaches an area of the farm that has already been covered.